Methodology for studying strain inhomogeneities in polycrystalline thin films during in situ thermal loading using coherent x-ray diffraction
نویسندگان
چکیده
Coherent x-ray diffraction is used to investigate the mechanical properties of a single grain within a polycrystalline thin film in situ during a thermal cycle. Both the experimental approach and finite element simulation are described. Coherent diffraction from a single grain has been monitored in situ at different temperatures. This experiment offers unique perspectives for the study of the mechanical properties of nano-objects. 6 Author to whom any correspondence should be addressed. New Journal of Physics 12 (2010) 035018 1367-2630/10/035018+12$30.00 © IOP Publishing Ltd and Deutsche Physikalische Gesellschaft
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تاریخ انتشار 2010